NanoStreeM project deliverables
The page lists 19 deliverables related to the research project "NanoStreeM".
List of Deliverables
| title and desprition | type | last update |
|---|---|---|
Training package available for safety professionals to conduct risk banding, risk assessments and monitoring.Training package available for safety professionals to conduct risk banding, risk assessments and monitoring. Programme: H2020-EU.2.1.1. - Topic(s): ICT-25-2015 |
Other | 2019-07-22 |
Public final project reportPublic final project report Programme: H2020-EU.2.1.1. - Topic(s): ICT-25-2015 |
Documents, reports | 2019-07-22 |
Recommendations for use of emission monitoring as a complement to risk bandingRecommendations for use of emission monitoring as a complement to risk banding Programme: H2020-EU.2.1.1. - Topic(s): ICT-25-2015 |
Documents, reports | 2019-07-22 |
Public Project factsheetPublic Project factsheet Programme: H2020-EU.2.1.1. - Topic(s): ICT-25-2015 |
Documents, reports | 2019-07-22 |
Health monitoring guidelineHealth monitoring guideline Programme: H2020-EU.2.1.1. - Topic(s): ICT-25-2015 |
Documents, reports | 2019-07-22 |
A set of typical relevant exposure scenarios for NP’s in semiconductor industryA set of typical relevant exposure scenarios for NP’s in semiconductor industry Programme: H2020-EU.2.1.1. - Topic(s): ICT-25-2015 |
Documents, reports | 2019-07-22 |
Gap analysis on information and data for NP exposure scenarios in semiconductor industryGap analysis on information and data for NP exposure scenarios in semiconductor industryGap analysis on information and data for NP exposure scenarios in semiconductor industry Programme: H2020-EU.2.1.1. - Topic(s): ICT-25-2015 |
Documents, reports | 2019-07-22 |
Report about the Stakeholder WorkshopWorkshop report Programme: H2020-EU.2.1.1. - Topic(s): ICT-25-2015 |
Open Research Data Pilot | 2019-07-22 |
List of standards for air sampling, as applicable in semiconductor activity ; Gaps identified. List of standards for air sampling, as applicable in semiconductor activity Programme: H2020-EU.2.1.1. - Topic(s): ICT-25-2015 |
Documents, reports | 2019-05-31 |
For nanomaterials listed in D1.1, a list of associated tasks, activities and operations where exposure might occur.For nanomaterials listed in D1.1, a list of associated tasks, activities and operations where exposure might occur. Programme: H2020-EU.2.1.1. - Topic(s): ICT-25-2015 |
Documents, reports | 2019-05-31 |
Comparison of occupational exposure valuesComparison of occupational exposure values Programme: H2020-EU.2.1.1. - Topic(s): ICT-25-2015 |
Documents, reports | 2019-05-31 |
List of air sampling equipments & List of environmental and individual monitoring devices. List of air sampling equipments Programme: H2020-EU.2.1.1. - Topic(s): ICT-25-2015 |
Documents, reports | 2019-05-31 |
A list of nanomaterials currently used in the semiconductor sector to be considered within NANOSTREEMA list of nanomaterials currently used in the semiconductor sector to be considered within NANOSTREEM Programme: H2020-EU.2.1.1. - Topic(s): ICT-25-2015 |
Documents, reports | 2019-05-31 |
A list of nanomaterials that are of strategic importance for the semiconductor sector in the futureA list of nanomaterials that are of strategic importance for the semiconductor sector in the future Programme: H2020-EU.2.1.1. - Topic(s): ICT-25-2015 |
Documents, reports | 2019-05-31 |
Assessment report: gaps identified about water and wastewater characterizationAssessment report: gaps identified about water and wastewater characterization Programme: H2020-EU.2.1.1. - Topic(s): ICT-25-2015 |
Documents, reports | 2019-05-31 |
WebsiteWebsite Programme: H2020-EU.2.1.1. - Topic(s): ICT-25-2015 |
Websites, patent fillings, videos etc. | 2019-05-31 |
Internal training package available for operators and maintenance engineers inside the consortium.Internal training package available for operators and maintenance engineers inside the consortium. Programme: H2020-EU.2.1.1. - Topic(s): ICT-25-2015 |
Other | 2019-05-31 |
Identification of the most appropriate risk assessment methodologies (including gap analysis) for use in the semiconductor industry. Guidance on the use of risk assessment methodology for semiconductor industry (Combined deliverable T3.1 and T3.2).Identification of the most appropriate risk assessment methodologies (including gap analysis) for use in the semiconductor industry. Guidance on the use of risk assessment methodology for semiconductor industry (Combined deliverable T3.1 and T3.2). Programme: H2020-EU.2.1.1. - Topic(s): ICT-25-2015 |
Documents, reports | 2019-05-31 |
Report on establishment NanoStreeM Safety CommunityReport on establishment NanoStreeM Safety Community Programme: H2020-EU.2.1.1. - Topic(s): ICT-25-2015 |
Documents, reports | 2019-05-31 |