Explore the words cloud of the TARANTO project. It provides you a very rough idea of what is the project "TARANTO" about.
The following table provides information about the project.
Coordinator |
STMICROELECTRONICS SA
Organization address contact info |
Coordinator Country | France [FR] |
Project website | http://tima.univ-grenoble-alpes.fr/taranto/ |
Total cost | 43˙000˙847 € |
EC max contribution | 12˙080˙989 € (28%) |
Programme |
1. H2020-EU.2.1.1.7. (ECSEL) |
Code Call | H2020-ECSEL-2016-1-RIA-two-stage |
Funding Scheme | ECSEL-RIA |
Starting year | 2017 |
Duration (year-month-day) | from 2017-04-01 to 2020-11-30 |
Take a look of project's partnership.
The TARANTO project targets to break the technological barriers to the development of the next BiCMOS technology platforms, allowing the improvement of the performance of the HBT (Heterojunction Bipolar Transistors) with a much higher level of integration. This new generation of transistors HBT will be a key factor to meet the needs of high-speed communications systems and high data rate required for the integration of heterogeneous intelligent systems as well as for intelligent mobility systems that will be used in future fully automated transport systems. The main objectives of this project will be to develop transistors HBT offering high maximum frequency (Fmax: 600GHz) built to very high density CMOS processes: 130 / 90nm for IFX, 55 / 28nm to ST, while IHP will work on the project to achieve maximum frequencies of 700GHz remaining compatible with IFX and ST BiCMOS processes.
The project consortium gathers the main European players in the value chain for these applications at very high frequencies, from laboratories to industrial users, thus ensuring the highest scientific level and the ability to validate the work carried out on appropriate demonstrators.
351_Intermediate report on System-level integration, simulation and characterization of targeted application circuits | Documents, reports | 2020-02-12 11:15:35 |
Take a look to the deliverables list in detail: detailed list of TARANTO deliverables.
year | authors and title | journal | last update |
---|---|---|---|
2017 |
H. Rücker, B Heinemann High Performance SiGe HBT BiCMOS Technology published pages: , ISSN: , DOI: |
IEEE RFIC Workshop: Silicon Technologies for mmWave Applications | 2020-02-12 |
2018 |
H. Rücker, B Heinemann High Performance SiGe BiCMOS Technology published pages: , ISSN: , DOI: |
German Microwave Week (GeMIC) | 2020-02-12 |
2017 |
P. Monsurrò, A. Trifiletti, L. Angrisani, M. D’Arco Multi-rate signal processing based model for high speed digitizers published pages: , ISSN: , DOI: |
International Instrumentation and Measurement Technology Conference | 2020-02-12 |
2018 |
K. Aufinger, J. Boeck, H. Knapp, W. Liebl, D. Manger, T. F. Meister, R. Lachner SiGe BiCMOS Technology for mm-Wave Applications – an Overview published pages: , ISSN: , DOI: |
18th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Applications | 2020-02-12 |
2017 |
S. Balanethiram, J. Berkner, R. D’Esposito, S. Fregonese, D. Celi, T. Zimmer Extracting the Temperature Dependence of Thermal Resistance from Temperature-Controlled DC Measurements of SiGe HBTs published pages: , ISSN: , DOI: |
IEEE BCTM | 2020-02-12 |
2017 |
M. Deng, S. Fregonese, D. Céli, P. Chevalier, M. De Matos, T. Zimmer Design of Silicon On-Wafer Sub-THz Calibration Kit published pages: , ISSN: , DOI: |
IEEE Mediterranean Microwave Symposium 2017 | 2020-02-12 |
2017 |
T. Zimmer, S. Fregonese, M. Deng Beyond 100 GHz: High frequency device characterization for THz applications published pages: , ISSN: , DOI: |
2nd Sino MOS-AK Workshop | 2020-02-12 |
2018 |
C. Yadav, M. Deng, M. De Matos, S. Fregonese, T. Zimmer Importance of complete characterization setup on on-wafer TRL calibration in sub-THz range published pages: , ISSN: , DOI: |
IEEE International Conference on Microelectronic Test Structures | 2020-02-12 |
2017 |
B. Heinemann High-Frequency SiGe HBTs for Communication, Radar and Imaging published pages: , ISSN: , DOI: |
Compound Semiconductor Week (CSW) | 2020-02-12 |
2017 |
S. Balanethiram, A. Chakravorty, R. D’Esposito, S. Fregonese, D. Céli, T. Zimmer Accurate Modeling of Thermal Resistance for On-Wafer SiGe HBTs Using Average Thermal Conductivity published pages: , ISSN: 0018-9383, DOI: |
IEEE Transactions on Electron Devices | 2020-02-12 |
2017 |
R. D\'Esposito, S. Fregonese, S. Balanethiram, and T. Zimmer Frequency analysis of the penetration depth of the heat flow in SiGe HBTs published pages: , ISSN: , DOI: |
29th BipAk | 2020-02-12 |
2017 |
A. Mukherjee, W. Liang, M. Schroter, U. Pfeiffer, R. Jain,J. Grzyb and P. Hillger Millimeter-wave Circuits and Applications published pages: , ISSN: , DOI: |
River Publishers Series in Electronic Materials and Devices | 2020-02-12 |
2017 |
W. Liang, A. Mukherjee, P. Sakalas, A. Pawlak, M. Schröter 96 GHz 4.7 mW low-power frequency tripler with 0.5 V supply voltage published pages: , ISSN: 0013-5194, DOI: |
IET Electronics Letters | 2020-02-12 |
2017 |
M. Jaoul, D. Céli, C. Maneux, M. Schröter, A. Pawlak Avalanche Compact Model Featuring SiGe HBTs Characteristics up to BVCBO published pages: , ISSN: , DOI: |
47th IEEE European Solid-State Device Research Conference (ESSDERC 2017) | 2020-02-12 |
2018 |
M. Margalef-Rovira, M. J. Barragan, P. Ferrari, and E. Pistono An Oscillation-Based Test technique for on-chip testing of mm-wave phase shifters published pages: , ISSN: , DOI: |
IEEE VLSI Test Symposium 2018 | 2020-02-12 |
2017 |
R. D’Esposito, S. Balanethiram, J.L. Battaglia, S. Frégonèse, T. Zimmer Thermal penetration depth investigations and BEOL metal impact on the thermal impedance in SiGe HBTs published pages: , ISSN: 0741-3106, DOI: |
IEEE Electron Device Letters | 2020-02-12 |
2017 |
C. Mukherjee, T. Jacquet, G. Fischer, T. Zimmer, C. Maneux Hot Carrier Degradation in SiGe HBTs: A Physical and Versatile Aging Compact Model published pages: , ISSN: 0018-9383, DOI: |
IEEE Transactions on Electron Devices | 2020-02-12 |
2017 |
P. Sakalas, M. Schroter, T. Nardmann, H. Zirath Harmonic distortion analysis of InP HBTs with 650 GHz fmax for high data rate communication systems published pages: , ISSN: , DOI: |
IEEE Compound Semiconductor Circuit Symposium (CSICS) | 2020-02-12 |
2018 |
J. Eisenbeis, M. Krause, T. Mahler, S. Scherr, and T. Zwick Path based MIMO channel model for hybrid beamforming architecture analysis published pages: , ISSN: , DOI: |
11th German Microwave Conference (GeMiC), 2018 | 2020-02-12 |
2019 |
C. Yadav, S. Fregonese, M. Deng, M. Cabbia, M. De Matos, M. Jaoul, and T. Zimmer Analysis of test structure design induced variation in on Si On-wafer TRL calibration in sub-THz published pages: , ISSN: , DOI: |
International Conference on Microelectronic Test Structures (ICMTS) | 2020-02-12 |
2018 |
M. Seif, F. Pascal, B. Sagnes, J. Elbeyrouthy, A. Hoffmann, S. Haendler, P. Chevalier, and D. Gloria Localization of 1/f noise sources in Si/SiGe:C HBTs published pages: , ISSN: , DOI: |
8th Int. Conf. Unsolved Probl. Noise - UPON 2018 | 2020-02-12 |
2018 |
Sebastien Fregonese, Magali De matos, Marina Deng, Manuel Potereau, Cedric Ayela, Klaus Aufinger, Thomas Zimmer On-Wafer Characterization of Silicon Transistors Up To 500 GHz and Analysis of Measurement Discontinuities Between the Frequency Bands published pages: 3332-3341, ISSN: 0018-9480, DOI: 10.1109/tmtt.2018.2832067 |
IEEE Transactions on Microwave Theory and Techniques 66/7 | 2020-02-12 |
2019 |
Mathieu Jaoul, Cristell Maneux, Didier Celi, Michael Schroter, Thomas Zimmer A Compact Formulation for Avalanche Multiplication in SiGe HBTs at High Injection Levels published pages: 264-270, ISSN: 0018-9383, DOI: 10.1109/ted.2018.2875494 |
IEEE Transactions on Electron Devices 66/1 | 2020-02-12 |
2018 |
W. Liebl, D. Manger, A. Pribil, S. Rothenhäußer, J. Böck, K. Aufinger New SiGe Technologies with Cut-off Frequencies towards 600 GHz and their Potential Impact on Future mmW Sensing in Automotive and Industrial Applications published pages: , ISSN: , DOI: |
IEEE IMS Workshop : Integrated mm Wave Sensing Technology for Automotive, Industrial and Healthcare | 2020-02-12 |
2018 |
A. Angrisani, M. D’Arco, P. Monsurrò, A. Trifiletti A 2-channel digitizer based on MFP strategy published pages: 52002, ISSN: 1742-6588, DOI: 10.1088/1742-6596/1065/5/052002 |
Journal of Physics: Conference Series 1065 | 2020-02-12 |
2019 |
K. Schuh, S. T. Le, R. Dischler and F. Buchali Transmission of 90 Gbd 32 QAM Over 480 km of SSMF with Kramers-Kronig Detection published pages: , ISSN: , DOI: |
2020-02-12 | |
2018 |
Pietro Monsurrò, Alessandro Trifiletti, Leopoldo Angrisani, Mauro D\'Arco Streamline calibration modelling for a comprehensive design of ATI-based digitizers published pages: 386-393, ISSN: 0263-2241, DOI: 10.1016/j.measurement.2018.04.099 |
Measurement 125 | 2020-02-12 |
2018 |
J. L. Battaglia, R. D’Esposito, S. Frégonèse, and T. Zimmer Heat transfer analysis in SiGe heterojunction bipolar transistor using analytical and system identification approaches published pages: , ISSN: , DOI: |
16th International Heat Transfer Conference (IHTC) | 2020-02-12 |
2019 |
M. Couret, G. Fischer, S. Frégonèse, T. Zimmer, and C. Maneux Physical, small signal and pulsed thermal impedance characterization of multi-fingers SiGe HBTs close to the SOA edges published pages: , ISSN: , DOI: |
International Conference on Microelectronic Test Structures (ICMTS) | 2020-02-12 |
2018 |
Joerg Eisenbeis, Tobias Mahler, Pablo Ramos Lopez, Thomas Zwick CHANNEL ESTIMATION METHOD FOR SUBARRAY BASED HYBRID BEAMFORMING SYSTEMS EMPLOYING SPARSE ARRAYS published pages: 25-38, ISSN: 1937-8718, DOI: 10.2528/pierc18062506 |
Progress In Electromagnetics Research C 87 | 2020-02-12 |
2019 |
Sebastien Fregonese, Marina Deng, Magali De Matos, Chandan Yadav, Simon Joly, Bernard Plano, Christian Raya, Bertrand Ardouin, Thomas Zimmer Comparison of On-Wafer TRL Calibration to ISS SOLT Calibration With Open-Short De-Embedding up to 500 GHz published pages: 89-97, ISSN: 2156-342X, DOI: 10.1109/tthz.2018.2884612 |
IEEE Transactions on Terahertz Science and Technology 9/1 | 2020-02-12 |
2018 |
A. Angrisani, M. D’Arco, P. Monsurrò, A. Trifiletti Parallel and hierarchical architectures of 4-channel MFP digitizer published pages: 52003, ISSN: 1742-6588, DOI: 10.1088/1742-6596/1065/5/052003 |
Journal of Physics: Conference Series 1065 | 2020-02-12 |
2017 |
C. Mukherjee, T. Jacquet, A. Chakravorty, T. Zimmer, J. Boeck, K. Aufinger, C. Maneux Random telegraph noise in SiGe HBTs: Reliability analysis close to SOA limit published pages: 146-152, ISSN: 0026-2714, DOI: 10.1016/j.microrel.2017.05.001 |
Microelectronics Reliability 73 | 2020-02-12 |
2018 |
C. Yadav, M. Deng, S. Fregonese, M. De Matos, T. Zimmer Extension of HICUM/L2 Avalanche Model at High Current: Proposal published pages: , ISSN: , DOI: |
30th BipAk | 2020-02-12 |
2019 |
M. Jaoul, D. Céli, D. Ney, C. Maneux, and T. Zimmer Analysis of a failure mechanism occurring in SiGe HBTs under mixed-mode stress conditions published pages: , ISSN: , DOI: |
International Conference on Microelectronic Test Structures (ICMTS) | 2020-02-12 |
2018 |
J. Borrel, A. Gauthier, F. Deprat, V. Lu, F. Abbate, S. Joblot, L.-R. Clément, H. Tupin, W. Zou, E. Arevalo, P. Chevalier, and D. Dutartre Thin film amorphization reduction using heated implantation for prevention of temperature-induced dewetting of implanted SOI published pages: , ISSN: , DOI: |
Proc. IIT | 2020-02-12 |
2018 |
S. T. Le, K. Schuh, M. Chagnon, F. Buchali and H. Buelow 1.6Tbps WDM Direct Detection Transmission with Virtual-Carrier over 1200km published pages: , ISSN: , DOI: |
2020-02-12 | |
2019 |
S. T. Le, K. Schuh, R. Dischler, F. Buchali, L. Schmalen and H. Buelow 5x—510 Gbps Single-Polarization Direct-Detection WDM Transmission over 80 km of SSMF published pages: , ISSN: , DOI: |
2020-02-12 |
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