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Opendata, web and dolomites

CITCOM SIGNED

A Complimentary Inspection Technique based on Computer Tomography and Plenoptic Camera for MEMS Components

Total Cost €

EC-Contrib. €

Partnership

Views

Outcomes and
results

CITCOM project word cloud

Explore the words cloud of the CITCOM project. It provides you a very rough idea of what is the project "CITCOM" about.

industry fracture abnormal critical document nature data validators advantage displacements yield iso13485 100 competitive faults 98 record possibility citcom reliability inspection degree aerospace for space industrial healthcare techniques coatings demonstrated 3d traces latest simply trl7 computer individual tomography chemical manufacturing medical limit surface optical difficult detection microsemi lack line composition give steer automated cut combined components yields mems action visible stains traceability ray robotic fabricated generation analyzing ultimately feedback 60 planar device suitable philips expects technological defects debris micro

Project "CITCOM" data sheet

The following table provides information about the project.

Coordinator	CSEM CENTRE SUISSE D'ELECTRONIQUE ET DE MICROTECHNIQUE SA - RECHERCHE ET DEVELOPPEMENT Organization address address: RUE JAQUET DROZ 1 city: NEUCHATEL postcode: 2000 website: www.csem.ch contact info title: n.a. name: n.a. surname: n.a. function: n.a. email: n.a. telephone: n.a. fax: n.a.
Coordinator Country	Switzerland [CH]
Project website	https://citcom.eu/
Total cost	5˙648˙170 €
EC max contribution	4˙763˙035 € (84%)
Programme	1. H2020-EU.2.1.5.1. (Technologies for Factories of the Future)
Code Call	H2020-FOF-2017
Funding Scheme	IA
Starting year	2017
Duration (year-month-day)	from 2017-10-01 to 2020-09-30

Partnership

Take a look of project's partnership.

#	participants	country	role	EC contrib. [€]
1	CSEM CENTRE SUISSE D'ELECTRONIQUE ET DE MICROTECHNIQUE SA - RECHERCHE ET DEVELOPPEMENT CSEM CENTRE SUISSE D'ELECTRONIQUE ET DE MICROTECHNIQUE SA - RECHERCHE ET DEVELOPPEMENT Organization address address: RUE JAQUET DROZ 1 city: NEUCHATEL postcode: 2000 website: www.csem.ch contact info title: n.a. name: n.a. surname: n.a. function: n.a. email: n.a. telephone: n.a. fax: n.a.	CH (NEUCHATEL)	coordinator	813˙621.00
2	TWI LIMITED TWI LIMITED Organization address address: GRANTA PARK GREAT ABINGTON city: CAMBRIDGE postcode: CB21 6AL website: www.twi.co.uk contact info title: n.a. name: n.a. surname: n.a. function: n.a. email: n.a. telephone: n.a. fax: n.a.	UK (CAMBRIDGE)	participant	770˙105.00
3	BRUNEL UNIVERSITY LONDON BRUNEL UNIVERSITY LONDON Organization address address: KINGSTON LANE city: UXBRIDGE postcode: UB8 3PH website: www.brunel.ac.uk contact info title: n.a. name: n.a. surname: n.a. function: n.a. email: n.a. telephone: n.a. fax: n.a.	UK (UXBRIDGE)	participant	529˙871.00
4	EXCILLUM AB EXCILLUM AB Organization address address: JAN STENBECKS TORG 17 city: KISTA postcode: 164 40 website: www.excillum.com contact info title: n.a. name: n.a. surname: n.a. function: n.a. email: n.a. telephone: n.a. fax: n.a.	SE (KISTA)	participant	460˙551.00
5	AIXACCT SYSTEMS GMBH AIXACCT SYSTEMS GMBH Organization address address: Talbotstr 25 city: AACHEN postcode: 52068 website: www.aixacct.com contact info title: n.a. name: n.a. surname: n.a. function: n.a. email: n.a. telephone: n.a. fax: n.a.	DE (AACHEN)	participant	450˙094.00
6	Teknologian tutkimuskeskus VTT Oy Teknologian tutkimuskeskus VTT Oy Organization address address: VUORIMIEHENTIE 3 city: Espoo postcode: 2150 website: www.vtt.fi contact info title: n.a. name: n.a. surname: n.a. function: n.a. email: n.a. telephone: n.a. fax: n.a.	FI (Espoo)	participant	345˙561.00
7	PHILIPS ELECTRONICS NEDERLAND BV PHILIPS ELECTRONICS NEDERLAND BV Organization address address: HIGH TECH CAMPUS 52 city: EINDHOVEN postcode: 5656 AG website: www.philips.com contact info title: n.a. name: n.a. surname: n.a. function: n.a. email: n.a. telephone: n.a. fax: n.a.	NL (EINDHOVEN)	participant	325˙452.00
8	RAYTRIX GMBH RAYTRIX GMBH Organization address address: Schauenburgerstrasse 116 city: Kiel postcode: 24118 website: n.a. contact info title: n.a. name: n.a. surname: n.a. function: n.a. email: n.a. telephone: n.a. fax: n.a.	DE (Kiel)	participant	308˙249.00
9	INNOVATIVE TECHNOLOGY AND SCIENCE LIMITED - INNOTECUK INNOVATIVE TECHNOLOGY AND SCIENCE LIMITED - INNOTECUK Organization address address: HILDERSHAM ROAD NORTH WING THE OLD LIVERY city: CAMBRIDGE postcode: CB21 6DR website: n.a. contact info title: n.a. name: n.a. surname: n.a. function: n.a. email: n.a. telephone: n.a. fax: n.a.	UK (CAMBRIDGE)	participant	306˙293.00
10	ACONDICIONAMIENTO TARRASENSE ASSOCIACION ACONDICIONAMIENTO TARRASENSE ASSOCIACION Organization address address: CARRER DE LA INNOVACIO 2 city: TERRASSA postcode: 8225 website: www.leitat.org contact info title: n.a. name: n.a. surname: n.a. function: n.a. email: n.a. telephone: n.a. fax: n.a.	ES (TERRASSA)	participant	238˙562.00
11	MICROSEMI SEMICONDUCTOR LIMITED MICROSEMI SEMICONDUCTOR LIMITED Organization address address: PHASE 2 CASTLEGATE BUSINESS PARK city: GWENT postcode: NP26 5YW website: n.a. contact info title: n.a. name: n.a. surname: n.a. function: n.a. email: n.a. telephone: n.a. fax: n.a.	UK (GWENT)	participant	112˙118.00
12	POLYTEC LIMITED POLYTEC LIMITED Organization address address: LAMBDA HOUSE LOWER LUTON ROAD city: HARPENDEN, HERTFORDSHIRE postcode: AL5 5BZ website: n.a. contact info title: n.a. name: n.a. surname: n.a. function: n.a. email: n.a. telephone: n.a. fax: n.a.	UK (HARPENDEN, HERTFORDSHIRE)	participant	102˙554.00

Map

Project objective

For the latest generation of micro-fabricated devices that are currently being developed, no suitable in-line production inspection equipment is available, simply because current inspection equipment expects planar processing while most of the devices are often highly 3D in nature e.g. medical. This lack of automated processing feedback makes it difficult to steer process development towards higher yields in micro-components and MEMS production. Another visible problem is the need to document and record process data, even on the individual device level, with the degree of traceability as is required for example, for medical devices fabricated under ISO13485. Both factors in the end limit the possibility of reliable and cost effective manufacturing of MEMS and micro-components. Thus, CITCOM has been proposed to address the industrial needs of MEMS and micro-manufacturing which will offer an in-line production inspection and measurement system for micro-components. The system will be developed and demonstrated at TRL7. The system will be based on optical and X-ray techniques combined with computer tomography and advance robotic system capable of analyzing defects that occur in production of micro components e.g. stains, debris, fracture, abnormal displacements, chemical composition of surface coatings, surface traces etc. enabling 98% yield and 100% reliability. Ultimately, CITCOM will cut such costs by 60% as it will offer a system with automated knowledge and inspection data based process feedback that will allow the detection and traceability of faults that may occur in MEMS production, especially for critical applications like aerospace, space and healthcare. CITCOM will give Europe a technological and competitive advantage in the growing manufacturing and production industry. The consortium behind this action is strongly driven by industrial need and problem having Philips and Microsemi as end users and validators of the technology.

Deliverables

List of deliverables.
Project website	Demonstrators, pilots, prototypes	2020-04-09 01:56:19
Dissemination toolkit	Documents, reports	2020-04-09 01:56:19

Take a look to the deliverables list in detail: detailed list of CITCOM deliverables.

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The information about "CITCOM" are provided by the European Opendata Portal: CORDIS opendata.