COUNTATOMS

Counting Atoms in nanomaterials

 Coordinatore UNIVERSITEIT ANTWERPEN 

Spiacenti, non ci sono informazioni su questo coordinatore. Contattare Fabio per maggiori infomrazioni, grazie.

 Nazionalità Coordinatore Belgium [BE]
 Totale costo 2˙000˙160 €
 EC contributo 2˙000˙160 €
 Programma FP7-IDEAS-ERC
Specific programme: "Ideas" implementing the Seventh Framework Programme of the European Community for research, technological development and demonstration activities (2007 to 2013)
 Code Call ERC-2009-AdG
 Funding Scheme ERC-AG
 Anno di inizio 2010
 Periodo (anno-mese-giorno) 2010-01-01   -   2014-12-31

 Partecipanti

# participant  country  role  EC contrib. [€] 
1    UNIVERSITEIT ANTWERPEN

 Organization address address: PRINSSTRAAT 13
city: ANTWERPEN
postcode: 2000

contact info
Titolo: Ms.
Nome: Marianne
Cognome: Samson
Email: send email
Telefono: +32 3 265 38 00
Fax: +32 3 265 33 18

BE (ANTWERPEN) hostInstitution 2˙000˙160.00
2    UNIVERSITEIT ANTWERPEN

 Organization address address: PRINSSTRAAT 13
city: ANTWERPEN
postcode: 2000

contact info
Titolo: Prof.
Nome: Gustaaf
Cognome: Van Tendeloo
Email: send email
Telefono: -2653233
Fax: -2653289

BE (ANTWERPEN) hostInstitution 2˙000˙160.00

Mappa


 Word cloud

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kv    us    probing    atoms    precision    counting    atomic    pm    technique    experimental    resolution    materials    probe    nano    interface    real    electron   

 Obiettivo del progetto (Objective)

'COUNTING ATOMS IN NANOMATERIALS Advanced electron microscopy for solid state materials has evolved from a qualitative imaging setup to a quantitative scientific technique. This will allow us not only to probe and better understand the fundamental behaviour of (nano) materials at an atomic level but also to guide technology towards new horizons. The installation in 2009 of a new and unique electron microscope with a real space resolution of 50 pm and an energy resolution of 100 meV will make it possible to perform unique experiments. We believe that the position of atoms at an interface or at a surface can be determined with a precision of 1 pm; this precision is essential as input for modelling the materials properties. It will be first applied to explain the fascinating behaviour of multilayer ceramic materials. The new experimental limits will also allow us to literally count the number of atoms within an atomic columns; particularly counting the number of foreign atoms. This will not only require experimental skills, but also theoretical support. A real challenge is probing the magnetic and electronic information of a single atom column. According to theory this would be possible using ultra high resolution. This new probing technique will be of extreme importance for e.g. spintronics. Modern (nano) technology more and more requires information in 3 dimensions (3D), rather than in 2D. This is possible through electron tomography; this technique will be optimised in order to obtain sub nanometer precision. A final challenge is the study of the interface between soft matter (bio- or organic materials) and hard matter. This was hitherto impossible because of the radiation damage of the electron beam. With the possibility to lower the voltage to 80 kV and possibly 50 kV, maintaining more or less the resolution, we will hopefully be able to probe the active sites for catalysis.'

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