Coordinatore | TECHNISCHE UNIVERSITEIT DELFT
Organization address
address: Stevinweg 1 contact info |
Nazionalità Coordinatore | Netherlands [NL] |
Totale costo | 4˙328˙513 € |
EC contributo | 3˙232˙637 € |
Programma | FP7-NMP
Specific Programme "Cooperation": Nanosciences, Nanotechnologies, Materials and new Production Technologies |
Code Call | FP7-NMP-2012-SME-6 |
Funding Scheme | CP-TP |
Anno di inizio | 2013 |
Periodo (anno-mese-giorno) | 2013-03-01 - 2016-08-31 |
# | ||||
---|---|---|---|---|
1 |
TECHNISCHE UNIVERSITEIT DELFT
Organization address
address: Stevinweg 1 contact info |
NL (DELFT) | coordinator | 601˙813.65 |
2 |
TECHNISCHE UNIVERSITAET WIEN
Organization address
address: Karlsplatz 13 contact info |
AT (WIEN) | participant | 576˙165.60 |
3 |
NANOSURF AG
Organization address
address: GRAUBERNSTRASSE 12-14 contact info |
CH (LIESTAL) | participant | 376˙680.00 |
4 |
SIOS MESSTECHNIK
Organization address
address: AM VOGELHERD 46 contact info |
DE (ILMENAU) | participant | 360˙960.80 |
5 |
NANOWORLD SERVICES GMBH
Organization address
address: SCHOTTKYSTRASSE 10 contact info |
DE (ERLANGEN) | participant | 303˙371.75 |
6 |
AGENCIA ESTATAL CONSEJO SUPERIOR DE INVESTIGACIONES CIENTIFICAS
Organization address
address: CALLE SERRANO 117 contact info |
ES (MADRID) | participant | 261˙969.50 |
7 |
VSL B.V.
Organization address
address: THIJSSEWEG 11 contact info |
NL (DELFT) | participant | 210˙507.50 |
8 |
NANOTECCENTER WEIZ FORSCHUNGSGESELLSCHAFT MBH
Organization address
address: FRANZ PICHLERSTRASSE 32 contact info |
AT (Weiz) | participant | 158˙458.00 |
9 |
FLUBETECH S.L.
Organization address
address: CTRA NACIONAL N 150 KM 14 contact info |
ES (TERRASSA BARCELONA) | participant | 139˙440.00 |
10 |
Nanotools GMBH
Organization address
address: Reichenbachstr 33 contact info |
DE (Munich) | participant | 89˙400.00 |
11 |
INSTITUT QUIMIC DE SARRIA
Organization address
address: CALLE VIA AUGUSTA 384-394 contact info |
ES (Barcelona) | participant | 83˙240.00 |
12 |
PEPM
Organization address
address: HOEFBLADSTRAAT 16 contact info |
NL (ALPHEN AAN DEN RIJN) | participant | 63˙950.40 |
13 |
ANTON PAAR GMBH
Organization address
address: ANTON PAAR STRASSE 20 contact info |
AT (GRAZ STRASSGANG) | participant | 6˙679.08 |
Esplora la "nuvola delle parole (Word Cloud) per avere un'idea di massima del progetto.
'Knowing the mechanical properties of workpieces and machine-tools also at the nanometer scale is an absolute necessity for an efficient nanoscale production. Current technologies are lacking the flexibility and robustness needed for measuring such key parameters as topography, morphology, roughness, adhesion, or micro- and nano-hardness directly in a production environment. This hinders rapid development cycles and resource efficient process and quality control. The following technology and methodology gaps for addressing these challenges were identified: Efficient disturbance rejection and systems stability; robustness and longevity of probes; short time to data (i.e. high-speed measurements and data handling); and traceability of the measurement. The project aim4np strives at solving this problem by combining measuring techniques developed in nanoscience with novel control techniques from mechatronics and procedures from traceable metrology.
Goal and Deliverable The main deliverable will be a fast robotic metrology platform and operational procedures for measuring with nanometer resolution and in a traceable way the topography, morphology, roughness, micro- and nano-hardness, and adhesive properties of large samples in a production environment.'
EU-funded scientists are developing much-needed technology for measuring with nano-scale resolution the mechanical properties of work pieces and the machinery that makes them. This will significantly cut production costs and boost competitiveness.
Delivering a product consistent with an engineer's design requires careful monitoring and control of both the work piece and machine tool's key mechanical properties. Parameters including topography, morphology, roughness, adhesion, and micro- and nano-hardness are critical, yet there are no flexible and reliable technologies available to monitor them in-line during production.
The EU-funded project 'Automated in-line metrology for nanoscale production' (AIM4NP) is remedying this to ensure rapid development cycles and resource efficiency. Scientists are exploiting nanotechnology measuring (metrology) techniques and novel control methodologies to deliver a robotic metrology platform with nanometre resolution of large samples in an industrial setting.
Team members have developed a beta version of the metrology platform according to selected production sites and design requirements. It includes an optical tracking sensor and a six degrees-of-freedom optical tracking actuator. A prototype of the atomic force microscopy (AFM) metrology head scanner has been built and is currently being tested. It exploits self-sensing, piezoresistive AFM sensors. Technology has been presented at the Transducers 2013 Conference in Barcelona, Spain.
AIM4NP robot-mounted metrology is expected to significantly cut production costs thanks to optimised production parameters. This will enhance product quality with reduced material and energy losses. In addition, maintenance and repair costs will be reduced thanks to better monitoring of the machinery itself. The end result is a major enhancement in competitiveness for the EU high-tech industry at the forefront of equipment suppliers for high-precision, high-volume manufacturing.