AIM4NP

Automated in-line Metrology for Nanoscale Production

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 Obiettivo del progetto (Objective)

'Knowing the mechanical properties of workpieces and machine-tools also at the nanometer scale is an absolute necessity for an efficient nanoscale production. Current technologies are lacking the flexibility and robustness needed for measuring such key parameters as topography, morphology, roughness, adhesion, or micro- and nano-hardness directly in a production environment. This hinders rapid development cycles and resource efficient process and quality control. The following technology and methodology gaps for addressing these challenges were identified: Efficient disturbance rejection and systems stability; robustness and longevity of probes; short time to data (i.e. high-speed measurements and data handling); and traceability of the measurement. The project aim4np strives at solving this problem by combining measuring techniques developed in nanoscience with novel control techniques from mechatronics and procedures from traceable metrology.

Goal and Deliverable The main deliverable will be a fast robotic metrology platform and operational procedures for measuring with nanometer resolution and in a traceable way the topography, morphology, roughness, micro- and nano-hardness, and adhesive properties of large samples in a production environment.'

Introduzione (Teaser)

EU-funded scientists are developing much-needed technology for measuring with nano-scale resolution the mechanical properties of work pieces and the machinery that makes them. This will significantly cut production costs and boost competitiveness.

Descrizione progetto (Article)

Delivering a product consistent with an engineer's design requires careful monitoring and control of both the work piece and machine tool's key mechanical properties. Parameters including topography, morphology, roughness, adhesion, and micro- and nano-hardness are critical, yet there are no flexible and reliable technologies available to monitor them in-line during production.

The EU-funded project 'Automated in-line metrology for nanoscale production' (AIM4NP) is remedying this to ensure rapid development cycles and resource efficiency. Scientists are exploiting nanotechnology measuring (metrology) techniques and novel control methodologies to deliver a robotic metrology platform with nanometre resolution of large samples in an industrial setting.

Team members have developed a beta version of the metrology platform according to selected production sites and design requirements. It includes an optical tracking sensor and a six degrees-of-freedom optical tracking actuator. A prototype of the atomic force microscopy (AFM) metrology head scanner has been built and is currently being tested. It exploits self-sensing, piezoresistive AFM sensors. Technology has been presented at the Transducers 2013 Conference in Barcelona, Spain.

AIM4NP robot-mounted metrology is expected to significantly cut production costs thanks to optimised production parameters. This will enhance product quality with reduced material and energy losses. In addition, maintenance and repair costs will be reduced thanks to better monitoring of the machinery itself. The end result is a major enhancement in competitiveness for the EU high-tech industry at the forefront of equipment suppliers for high-precision, high-volume manufacturing.