NEMINTEM

In-situ NanoElectrical Measurements in a Transmission Electron Microscope

Coordinatore	TECHNISCHE UNIVERSITEIT DELFT    more Spiacenti, non ci sono informazioni su questo coordinatore. Contattare Fabio per maggiori infomrazioni, grazie.
Nazionalità Coordinatore	Netherlands [NL]
Totale costo	2˙500˙000 €
EC contributo	2˙500˙000 €
Programma	FP7-IDEAS-ERC Specific programme: "Ideas" implementing the Seventh Framework Programme of the European Community for research, technological development and demonstration activities (2007 to 2013)
Code Call	ERC-2010-AdG_20100224
Funding Scheme	ERC-AG
Anno di inizio	2011
Periodo (anno-mese-giorno)	2011-04-01   -   2016-03-31

 Partecipanti

#	participant	country	role	EC contrib. [€]
1	TECHNISCHE UNIVERSITEIT DELFT  Organization address address: Stevinweg 1 city: DELFT postcode: 2628 CN contact info Titolo: Ms. Nome: Ada Cognome: Ruiterman Email: send email Telefono: +31 15 278 30 00 Fax: +31 15 278 79 76	NL (DELFT)	hostInstitution	2˙500˙000.00
2	TECHNISCHE UNIVERSITEIT DELFT  Organization address address: Stevinweg 1 city: DELFT postcode: 2628 CN contact info Titolo: Prof. Nome: Hendrik Willem Cognome: Zandbergen Email: send email Telefono: +31 15 278 22 66 Fax: +31 15 278 66 00	NL (DELFT)	hostInstitution	2˙500˙000.00

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 Obiettivo del progetto (Objective)

'Nanocharacterization techniques are becoming increasingly important. They help us to determine local atomic arrangements, element compositions as well as electronic structures. High-Resolution Transmission Electron Microscopy (HRTEM) is the most powerful and widely accepted technique. However, until recently in-situ HRTEM did not show sufficient resolution to image changes on the atomic scale. In the last five years, my group has pioneered advanced specimen holders towards in-situ HRTEM. We have leading expertise in obtaining the high resolution in a range of controllable environments: temperatures, pressures, and liquids. In addition, combinations with other types of parallel measurements were pioneered, such as in-situ low-noise electrical characterization. Clearly it is indeed possible to operate the HRTEM as a nanolaboratory. It allows to really see what one is measuring. With this proposal I want to realize the equipment and methodology to perform nano-electrical measurements of nanostructures in-situ in a HRTEM. The NanoElectrical Measurements in a Transmission Electron Microscope (NEMinTEM) will be applied to nanostructures of a range of materials. Furthermore the electron beam will be used to make well-controlled modifications of the nanostructure. The effects of these modifications on the electrical properties will be measured simultaneously. Semiconductor nanowires, graphene, metallic bridges and nanoelectrodes, and oxide multilayers will be studied, providing challenging examples with possible high-impact results It is to be expected that once NEMinTEM is mature, it will be applied to many more materials.'