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POLAR-EM

Automated tools for atomic resolution mapping of electrostatic fields in the electron microscope

Total Cost €

0

EC-Contrib. €

0

Partnership

0

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 POLAR-EM project word cloud

Explore the words cloud of the POLAR-EM project. It provides you a very rough idea of what is the project "POLAR-EM" about.

technique    functionalities    fast    fashion    partial    conventional    microscopy    first    techniques    form    geometry    detectors    contrast    potentials    generation    ensuing    acquisition    hardware    direct    tools    straightforward    electrostatic    inexpensive    diffraction    time    dpc    ad    last    ultra    specialists    segmented    lab    material    line    pressing    pattern    off    materials    chosen    unaffordable    polarization    ferroelectric    resolution    reported    overarching    routines    community    column    probe    function    linear    mapping    differential    basic    hoc    geometries    sensitive    electron    tool    acquire    microscope    pixelated    integration    made    local    scientific    replace    physical    manner    variation    reproduced    regions    imaging    record    cameras    detector    flexible    relies    atomic    degree    configurations    disk    position    software    complexity    image    bright    decade    images    mathematical    revolutionize    maps    operations    post    map    outsmart    idea   

Project "POLAR-EM" data sheet

The following table provides information about the project.

Coordinator
UNIVERSIDAD COMPLUTENSE DE MADRID 

Organization address
address: AVENIDA DE SENECA 2
city: MADRID
postcode: 28040
website: http://www.ucm.es

contact info
title: n.a.
name: n.a.
surname: n.a.
function: n.a.
email: n.a.
telephone: n.a.
fax: n.a.

 Coordinator Country Spain [ES]
 Total cost 150˙000 €
 EC max contribution 150˙000 € (100%)
 Programme 1. H2020-EU.1.1. (EXCELLENT SCIENCE - European Research Council (ERC))
 Code Call ERC-2016-PoC
 Funding Scheme ERC-POC
 Starting year 2017
 Duration (year-month-day) from 2017-12-01   to  2019-05-31

 Partnership

Take a look of project's partnership.

# participants  country  role  EC contrib. [€] 
1    UNIVERSIDAD COMPLUTENSE DE MADRID ES (MADRID) coordinator 150˙000.00

Map

 Project objective

The overarching goal of this proposal is to produce a software tool that will allow inexpensive atomic resolution mapping of electrostatic potentials and fields within materials in the electron microscope. Such mapping capabilities could revolutionize our understanding of future materials for devices based on exploiting functionalities such as ferroelectric polarization. During the last decade, the scientific community has addressed this pressing need by developing microscopy techniques sensitive to the local potential such as the recently reported differential phase contrast (DPC) imaging technique. DPC can, for the first time, map the distribution of electrostatic potential and field within a material in an atomic column-by-atomic column fashion in a direct way. However, DPC imaging relies on the use of non-flexible segmented detectors with non-linear geometries. The increasing degree of physical complexity has made this approach rather unaffordable for a conventional materials research lab composed of non-specialists. The technology we propose here will replace such detectors by software tools and produce similar atomic resolution maps. The key idea is to acquire electron diffraction images with more conventional detectors and then apply post-acquisition analysis routines. Pixelated detectors (i.e., cameras) will be used to record the variation of the electron diffraction pattern as a function of probe position. Imaging configurations similar to DPC will be chosen after acquisition: a given detector geometry can be reproduced off-line by partial, ad-hoc integration of regions of the electron diffraction pattern over at each probe position. Basic mathematical operations between images ensuing form those different regions of the bright field disk will produce a DPC image in a straightforward manner. Such a technology will outsmart complex non-flexible hardware only by inexpensive software routines working on the new generation of ultra-fast cameras.

 Publications

year authors and title journal last update
List of publications.
2019 Vicent Lloret, Miguel Ángel Rivero-Crespo, José Alejandro Vidal-Moya, Stefan Wild, Antonio Doménech-Carbó, Bettina S. J. Heller, Sunghwan Shin, Hans-Peter Steinrück, Florian Maier, Frank Hauke, Maria Varela, Andreas Hirsch, Antonio Leyva-Pérez, Gonzalo Abellán
Few layer 2D pnictogens catalyze the alkylation of soft nucleophiles with esters
published pages: , ISSN: 2041-1723, DOI: 10.1038/s41467-018-08063-3
Nature Communications 10/1 2019-10-15
2018 Stephen J. Pennycook, Changjian Li, Mengsha Li, Chunhua Tang, Eiji Okunishi, Maria Varela, Young-Min Kim, Jae Hyuck Jang
Material structure, properties, and dynamics through scanning transmission electron microscopy
published pages: , ISSN: 2093-3371, DOI: 10.1186/s40543-018-0142-4
Journal of Analytical Science and Technology 9/1 2019-10-15
2018 L. Bégon-Lours, V. Rouco, Qiao Qiao, A. Sander, M. A. Roldán, R. Bernard, J. Trastoy, A. Crassous, E. Jacquet, K. Bouzehouane, M. Bibes, J. Santamaría, A. Barthélémy, M. Varela, Javier E. Villegas
Factors limiting ferroelectric field-effect doping in complex oxide heterostructures
published pages: , ISSN: 2475-9953, DOI: 10.1103/physrevmaterials.2.084405
Physical Review Materials 2/8 2019-10-15
2018 Gabriel Sánchez-Santolino, Juan Salafranca, Sokrates T. Pantelides, Stephen J. Pennycook, Carlos León, María Varela
Localization of Yttrium Segregation within YSZ Grain Boundary Dislocation Cores
published pages: 1800349, ISSN: 1862-6300, DOI: 10.1002/pssa.201800349
physica status solidi (a) 215/19 2019-10-15
2018 V. J. Gómez, J. Grandal, A. Núñez-Cascajero, F. B. Naranjo, M. Varela, M. A. Sánchez-García, E. Calleja
Effect of different buffer layers on the quality of InGaN layers grown on Si
published pages: 105026, ISSN: 2158-3226, DOI: 10.1063/1.5046756
AIP Advances 8/10 2019-10-15

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