3D NANOCHEMISCOPE
Combined SIMS-SFM Instrument for the 3-Dimensional Chemical Analysis of Nanostructures
| Coordinatore | ION-TOF TECHNOLOGIES GMBH
Organization address
address: Heisenbergstrasse 15 contact info |
| Nazionalità Coordinatore | Germany [DE] |
| Sito del progetto | http://www.3dnanochemiscope.eu |
| Totale costo | 5˙284˙260 € |
| EC contributo | 4˙033˙699 € |
| Programma | FP7-NMP
Specific Programme "Cooperation": Nanosciences, Nanotechnologies, Materials and new Production Technologies |
| Code Call | FP7-NMP-2007-SME-1 |
| Funding Scheme | CP-TP |
| Anno di inizio | 2008 |
| Periodo (anno-mese-giorno) | 2008-09-15 - 2013-01-14 |
Partecipanti
| # | ||||
|---|---|---|---|---|
| 1 |
ION-TOF TECHNOLOGIES GMBH
Organization address
address: Heisenbergstrasse 15 contact info |
DE (MUNSTER) | coordinator | 0.00 |
| 2 |
"USTAV PRISTROJOVE TECHNIKY AV CR, v.v.i."
Organization address
address: KRALOVOPOLSKA 147 contact info |
CZ (BRNO) | participant | 0.00 |
| 3 |
EIDGENOESSISCHE MATERIALPRUEFUNGS- UND FORSCHUNGSANSTALT
Organization address
address: Ueberlandstrasse 129 contact info |
CH (DUEBENDORF) | participant | 0.00 |
| 4 |
NANOSCAN AG
Organization address
address: Ueberlandstrasse 129 contact info |
CH (DUBENDORF) | participant | 0.00 |
| 5 |
NEDERLANDSE ORGANISATIE VOOR TOEGEPAST NATUURWETENSCHAPPELIJK ONDERZOEK TNO
Organization address
address: Schoemakerstraat 97 contact info |
NL (DEN HAAG) | participant | 0.00 |
| 6 |
TECHNISCHE UNIVERSITAET WIEN
Organization address
address: Karlsplatz 13 contact info |
AT (WIEN) | participant | 0.00 |
| 7 |
UNIVERSITE CATHOLIQUE DE LOUVAIN
Organization address
address: Place De L'Universite 1 contact info |
BE (LOUVAIN LA NEUVE) | participant | 0.00 |
| 8 |
UNIVERSITE DE NAMUR ASBL
Organization address
address: Rue de Bruxelles 61 contact info |
BE (NAMUR) | participant | 0.00 |
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Obiettivo del progetto (Objective)
'The objective of this project is to develop an innovative and novel combination of a new TOF-SIMS with substantially improved lateral resolution and sensitivity, combined with a new metrological high resolution SFM. The two techniques provide complementary information on nanoscale surface chemistry and surface morphology. In combination with a layer by layer removal of material using low energy sputtering, quantitatively measured by SFM, this combined ultra-high vacuum (UHV) instrument will be unique for the 3-dimensional chemical characterisation of nanostructured inorganic as well as organic materials with down to at least 10 nm lateral resolution and down to 1 nm depth resolution. Joint by a novel software for the calculation and display of 3-dimensional distributions of all chemical species, this leads to a totally new “3D NanoChemiscope”.'