MANON

Methods for Advanced Multi-Objective Optimization for eDFY of complex Nano-scale Circuits

Coordinatore	STMICROELECTRONICS SRL    more  Organization address address: VIA C.OLIVETTI 2 city: AGRATE BRIANZA postcode: 20864 contact info Titolo: Mr. Nome: Salvatore Cognome: Rinaudo Email: send email Telefono: 390957000000 Fax: 390957000000
Nazionalità Coordinatore	Italy [IT]
Totale costo	752˙481 €
EC contributo	752˙481 €
Programma	FP7-PEOPLE Specific programme "People" implementing the Seventh Framework Programme of the European Community for research, technological development and demonstration activities (2007 to 2013)
Code Call	FP7-PEOPLE-2009-IAPP
Funding Scheme	MC-IAPP
Anno di inizio	2010
Periodo (anno-mese-giorno)	2010-10-01   -   2014-09-30

 Partecipanti

#	participant	country	role	EC contrib. [€]
1	STMICROELECTRONICS SRL  Organization address address: VIA C.OLIVETTI 2 city: AGRATE BRIANZA postcode: 20864 contact info Titolo: Mr. Nome: Salvatore Cognome: Rinaudo Email: send email Telefono: 390957000000 Fax: 390957000000	IT (AGRATE BRIANZA)	coordinator	172˙296.00
2	UNIVERSITA DEGLI STUDI DI ROMA LA SAPIENZA  Organization address address: Piazzale Aldo Moro 5 city: ROMA postcode: 185 contact info Titolo: Dr. Nome: Daniela Cognome: Padulo Email: send email Telefono: +39 06 44585418 Fax: +39 06 44585918	IT (ROMA)	participant	271˙472.00
3	FRAUNHOFER-GESELLSCHAFT ZUR FOERDERUNG DER ANGEWANDTEN FORSCHUNG E.V  Organization address address: Hansastrasse 27C city: MUENCHEN postcode: 80686 contact info Titolo: Ms. Nome: Andrea Cognome: Zeumann Email: send email Telefono: +49 89 1205 2723 Fax: +49 89 1205772723	DE (MUENCHEN)	participant	162˙362.00
4	MUNEDA GmbH  Organization address address: Stefan-George-Ring 29 city: Munich postcode: 81929 contact info Titolo: Dr. Nome: Bernd Cognome: Lemaitre Email: send email Telefono: +49 89 93086347 Fax: +49 89 93086 407	DE (Munich)	participant	146˙351.00

Mappa

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 Obiettivo del progetto (Objective)

'Cost control, production efficiency, cycle time and yield are critical quality benchmark for nanoelectronics productions. An increasingly important downside of nano-CMOS technology scaling is the fact that the scaling of feature sizes cannot be accompanied by a suitable scaling of geometric tolerances. In addition, when getting into deep miniaturized dimensions, phenomena like edges or surfaces roughness, or the fluctuation of the number of doping atoms within the channels are becoming increasingly significant. As a result, the figures of merit of a circuit, such as performance and power, have become extremely sensitive to uncontrollable statistical process variations (PV). To ensure stable manufacturability and secure high manufacturing yield, it is mandatory to manage complete design flows and to link traditional methods for design with Technology CAD models. In this context, multi-objective optimization algorithms and statistical analysis are essential on device and behavioral levels to secure high yielding by modeling the impact of inevitable process variations and doping fluctuations on IC performance. Statistical circuit modeling is a viable solution to nano-electronics production quality, on which the European Union is already investing. The project intends to create a partnership between academies, industry and SME so to create a Transfer of Knowledge between the organizations in order to pass the mathematical know how on multi-objective optimization, symbolic techniques and numerical statistical simulation on one side, the industrial design experience, real test cases availability and Electronic Design Automation (EDA) software modeling skills on the other. The scope of the research activity will be to create PV-aware and PV-robust circuit design techniques, tools and models in the frame of the analogue and mixed-signal circuit industrial design.'

Introduzione (Teaser)

The downside of scaling nanoelectronic feature sizes is increasing unreliability of performance and power (hence robustness). An EU-supported project has developed techniques to tackle this problem.