Coordinatore | KATHOLIEKE UNIVERSITEIT LEUVEN
Organization address
address: Oude Markt 13 contact info |
Nazionalità Coordinatore | Belgium [BE] |
Sito del progetto | http://fys.kuleuven.be/vsm/snowcontrol/ |
Totale costo | 4˙247˙139 € |
EC contributo | 2˙820˙000 € |
Programma | FP7-NMP
Specific Programme "Cooperation": Nanosciences, Nanotechnologies, Materials and new Production Technologies |
Code Call | FP7-NMP-2010-SME-4 |
Funding Scheme | CP-TP |
Anno di inizio | 2011 |
Periodo (anno-mese-giorno) | 2011-06-14 - 2015-06-13 |
# | ||||
---|---|---|---|---|
1 |
KATHOLIEKE UNIVERSITEIT LEUVEN
Organization address
address: Oude Markt 13 contact info |
BE (LEUVEN) | coordinator | 932˙436.00 |
2 |
BRUKER AXS GMBH
Organization address
address: OSTLICHE RHEINBRUCKENSTRASSE 49 contact info |
DE (KARLSRUHE) | participant | 618˙805.00 |
3 |
CORDOUAN TECHNOLOGIES SAS
Organization address
address: "CITE DE LA PHOTONIQUE, AVENUE DE CANTERANNE 11" contact info |
FR (PESSAC) | participant | 437˙773.80 |
4 |
DCA-INSTRUMENTS OY
Organization address
address: VAJOSSUONKATU 8 contact info |
FI (TURKU) | participant | 415˙800.00 |
5 |
KEMSTREAM SAS
Organization address
address: "RUE DE LA VIELLE POSTE, PIT DE LA POMPIGNANE T2" contact info |
FR (MONTPELLIER) | participant | 215˙699.70 |
6 |
IBM RESEARCH GMBH
Organization address
address: SAEUMERSTRASSE 4 contact info |
CH (RUESCHLIKON) | participant | 199˙485.50 |
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'One of the major barriers towards the successful introduction of nanoparticles (NP) into many applications is the lack of a tight control on their properties ((size, shape, crystallinity, composition, core-shell, functionalization, etc). This can only be resolved by the simultaneous use of several metrology methods, to extract the relevant information in real-time and to establish of a feedback control loop. In this project we take the first steps towards this goal by proposing the required concepts and methods.
The main goal of this project is therefore to develop real-time characterization metrology tools to measure the properties of nanoparticles, functionalized NPs and NP thin films. To enable a real-time and a complete characterization of NP properties we drastically extend the capabilities of Dynamic Light Scattering (DLS), Zeta Potential (ZP) and Small Angle X-ray Scattering (SAXS) and combine those into an integrated real-time NPs measurement platform.
New methods to measure the flux of NPs in the gas phase and the properties of NP thin films and heterostructures will be developed based on ultraviolet and vacuum ultraviolet radiation. These will be combined with Grazing Incidence SAXS and Reflection High Energy Electron Diffraction into a real-time NP thin film measurement platform.
Standard operating procedures will be developed for these instrument combinations so that a multi-method metrology standard can be defined based on the (quasi-) simultaneous measurement of complimentary properties with the different tools.
Finally, the capabilities of these integrated measurement platforms will be tested against two high throughput lines for the production of NP in solution and for the growth of NP thin films.
This project will be carried out by four Small and Medium Enterprises -- all active in equipment and metrology development -- two Industrial partners and two institutes for Higher and Secondary Education.'
New in-line and real-time automated measurement techniques to characterise nanoparticles (NPs) and NP-based thin films during production promise to revolutionise materials and devices.
Nanomaterials consisting of substances with dimensions on the scale of molecules are revolutionising devices in fields from medical technology to communications and energy. Shapes of NPs include simple spheres, hollow or layered spheres and rice-shaped particles. Their shape and size play a critical role in function yet there are no comprehensive real-time techniques for accurate measurement.
The EU-funded project 'Integrated real-time measurement platforms for nanoparticles and nanoparticle thin films' (SNOW CONTROL) has made major advances to deliver revolutionary automated and real-time characterisation of NPs and NP-based films during synthesis. The systems developed will be the first available worldwide with such capabilities, ensuring immediate commercial interest. Scientists focused on three existing measurement techniques: dynamic light scattering or DLS, zeta potential or ZP (a dispersion measure) and small angle X-ray scattering or SAXS.
The first platform, directed at NPs, uses DLS, ZP and SAXS to automatically characterise NPs of a selected size. Partners developed a remote DLS probe head to facilitate combining techniques. They delivered a completely new SAXS system to generate three to four times higher X-ray flux relative to other available lab sources. Optoelectronics in the form of classical electrophoresis enabled improved ZP measurement capability. The prototype enhanced measurement resolution and accuracy by a factor of three to 10 versus existing solutions. The real-time DLS and SAXS techniques were integrated into a flow-chemistry line to successfully measure the evolution of NP size.
The second platform uses in-line ultraviolet flux sensing and reflection high-energy electron diffraction (RHEED) to analyse and monitor vacuum deposition of NP thin films. Partners redesigned an existing liquid injection/vaporisation unit that was then integrated into the vacuum deposition system with the RHEED and the laser-based NP flux monitor. The platform has already been used to successfully grow NP thin films.
SNOW CONTROL has developed two real-time measurement platforms for automated NP production cycles. Automated control is a necessary but currently missing link in the production chain. Standardised, repeatable and robust NP quality will facilitate their optimal performance in many applications ranging from biomedical drug release to electronic devices.