Explore the words cloud of the PowerBase project. It provides you a very rough idea of what is the project "PowerBase" about.
The following table provides information about the project.
Coordinator |
INFINEON TECHNOLOGIES AUSTRIA AG
Organization address contact info |
Coordinator Country | Austria [AT] |
Project website | http://www.powerbase-project.eu |
Total cost | 90˙254˙494 € |
EC max contribution | 19˙196˙548 € (21%) |
Programme |
1. H2020-EU.2.1.1.7. (ECSEL) |
Code Call | ECSEL-2014-2 |
Funding Scheme | ECSEL-IA |
Starting year | 2015 |
Duration (year-month-day) | from 2015-05-01 to 2018-06-30 |
Take a look of project's partnership.
The key objective of PowerBase “Enhanced substrates and GaN pilot lines enabling compact power applications” is to ensure the availability of Electronic Components and Systems (ECS) for key markets and for addressing societal challenges, aiming at keeping Europe at the forefront of the technology development, bridging the gap between research and exploitation, creating economic and employment growth in the European Union. The project PowerBase aims to contribute to the industrial ambition of value creation in Europe and fully supports this vision by addressing key topics of ECSEL multi annual strategic plan 2014. By positioning PowerBase as innovation action a clear focus on exploitation of the expected result is primary goal. To expand the limits in current power semiconductor technologies the project focuses on setting up a qualified wide band gap GaN technology Pilot line, on expanding the limits of today’s silicon based substrate materials for power semiconductors, improving manufacturing efficiency by innovative automation, setting up of a GaN compatible chip embedding pilot line and demonstrating innovation potential in leading compact power application domains. PowerBase is a project proposal with a vertical supply chain involved with contributions from partners in 7 European countries. This spans expertise from raw material research, process innovation, pilot line, assembly innovation and pilot line up to various application domains representing enhanced smart systems. The supporting partners consist of market leaders in their domain, having excellent technological background, which are fully committed to achieve the very challenging project goals. The project PowerBase aims to have significant impact on mart regions. High tech jobs in the area of semiconductor technologies and micro/nano electronics in general are expressed core competences of the regions Austria: Carinthia, Styria, Germany: Sachsen, Bavaria and many other countries/ regions involved.
8.2.5.2 Organization of a workshop/training event | Other | 2019-05-20 13:14:24 |
D8.1.3.1 Press Release: Launching the PowerBase Project | Other | 2019-05-20 13:14:24 |
D8.2.5.1 Preparation of e-learning “Power electronics†module; | Other | 2019-05-20 13:14:24 |
D8.2.1.1 Initial Dissemination Plan and Set-up PowerBase Web-Site | Other | 2019-05-20 13:14:24 |
8.2.1.2 Final Report on Dissemination Activities | Documents, reports | 2019-05-20 13:14:24 |
D8.2.1.2 First Report on Dissemination Activities | Documents, reports | 2019-05-20 13:14:24 |
Take a look to the deliverables list in detail: detailed list of PowerBase deliverables.
year | authors and title | journal | last update |
---|---|---|---|
2016 |
N. Ganagona, I. Kolevatov. H.M. Ayedh, A. Galeckas, L. Vines, E.V. Monakhov and B.G. Svensson Point defects and impurities in mon-crystalline silicon - some recent advances published pages: , ISSN: , DOI: |
The 7th International Symposium on Advanced Science and Technology of Silicon Materials (2016) | 2019-06-18 |
2018 |
Ander Avila, Xavier Perpiña, Xavier Jorda, Asier Garcia-Bediaga, Alejandro Rujas Thermal performance analysis of GaN-based high-power converters published pages: , ISSN: , DOI: |
European Conference on Power Electronics and Applications | 2019-06-18 |
2018 |
Ander Avila, Asier Garcia-Bediaga, Alberto Rodriguez, Luis Mir, Alejandro Rujas Analysis of Optimal Operation Conditions for GaN-basedPower Converters published pages: , ISSN: , DOI: |
Energy Conversion Congress and Exposition | 2019-06-18 |
2018 |
Ben Rackauskas, Michael J. Uren, Steve Stoffels, Ming Zhao, Stefaan Decoutere, Martin Kuball Determination of the Self-Compensation Ratio of Carbon in AlGaN for HEMTs published pages: 1838-1842, ISSN: 0018-9383, DOI: 10.1109/ted.2018.2813542 |
IEEE Transactions on Electron Devices 65/5 | 2019-06-18 |
2017 |
Ming Zhao, Karen Geens, Xiangdong Li, Marleen Van Hove, Vesa-Pekka Lempinen, Jaakko Sormunen, Robert Langer, Stefaan Decoutere MOCVD Growth and Characterization of 200 V E-mode p-GaN HEMTs on 200 mm GaN-on-SOI for Monolithic Integration published pages: , ISSN: , DOI: |
ICNS-12 | 2019-06-18 |
2018 |
S. Stoffels, K. Geens, N. Posthuma, M. Zhao, H. Liang, X. Li, D. Wellekens, S. You, B. Bakeroot, M.Van Hove, S. Decoutere GaN Device architectures enabled by next generation substrates published pages: , ISSN: , DOI: |
GaN Marathon 2.0 | 2019-06-18 |
2017 |
L. Lymperakis, J. Neugebauer, M. Himmerlich, S. Krischok, M. Rink, J. Kröger, V. M. Polyakov Adsorption and desorption of hydrogen at nonpolar GaN ( 1 1 ¯ 00 ) surfaces: Kinetics and impact on surface vibrational and electronic properties published pages: 1-11, ISSN: 2469-9950, DOI: 10.1103/PhysRevB.95.195314 |
Physical Review B 95/19 | 2019-06-18 |
2017 |
F.P. Pribahsnik, M. Nelhiebel, M. Mataln, M. Bernardoni, G. Prechtl, F. Altmann, D. Poppitz, A. Lindemann Exploring the thermal limit of GaN power devices under extreme overload conditions published pages: 304-308, ISSN: 0026-2714, DOI: 10.1016/j.microrel.2017.07.046 |
Microelectronics Reliability 76-77 | 2019-06-18 |
2018 |
S. You, N. E. Posthuma, N. Ronchi, S. Stoffels, B. Bakeroot, D. Wellekens, H. Liang, M. Zhao and S. Decoutere Dielectrics choice and processing for low dispersion enhancement mode p-GaN gate HEMTs on 200mm Si substrates published pages: , ISSN: , DOI: |
Workshop on Compound Semiconductor Devices and Integrated Circuits held in Europe 2018 | 2019-06-18 |
2018 |
L. Stockmeier, C. Kranert, G. Raming, A. Miller, C. Reimann, P. Rudolph, J. Friedrich Edge facet dynamics during the growth of heavily doped n-type silicon by the Czochralski-method published pages: 57-65, ISSN: 0022-0248, DOI: 10.1016/j.jcrysgro.2018.03.028 |
Journal of Crystal Growth 491 | 2019-06-18 |
2018 |
X. Jordà , X. Perpiñà , M. Vellvehi, D. Sánchez, A. GarcÃa-Bediaga Thermal Characterization of SMD Packaged 650V GaN HEMTs Assembled in PCB Boards published pages: , ISSN: , DOI: |
GaN Marathon 2.0 | 2019-06-18 |
2018 |
F.P. Pribahsnik GaN specific mechanical phenomena and their influence on reliability in power HEMT operation published pages: , ISSN: , DOI: |
PhD thesis @ Faculty of electronics and information tecnhologies, Otto v Guericke Universität Magdeburg | 2019-06-18 |
2017 |
AleÅ¡ Chvála, Juraj Marek, Patrik PrÃbytný, Alexander Å atka, Steve Stoffels, Niels Posthuma, Stefaan Decoutere, Daniel Donoval Analysis of multifinger power HEMTs supported by effective 3-D device electrothermal simulation published pages: 148-155, ISSN: 0026-2714, DOI: 10.1016/j.microrel.2017.08.012 |
Microelectronics Reliability 78 | 2019-06-18 |
2018 |
N.E. Posthuma, S. You, S. Stoffels, H. Liang, M. Zhao and S. Decoutere Gate architecture design for enhancement mode p-GaN gate HEMTs for 200 and 650V applications published pages: , ISSN: , DOI: |
The 30th IEEE International Symposium on Power Semiconductor Devices and Ics (ISPSD) | 2019-06-18 |
2018 |
S. Stoffels, K. Geens, X. Li, M. Zhao, M. Borga, E. Zanoni, G. Meneghesso, M. Meneghini, N. Posthuma, M. Van Hove and S. Decoutere Substrate optimization for high reliability GaN devices published pages: , ISSN: , DOI: |
MRS2018 Symposium | 2019-06-18 |
2018 |
X. Jordà , X. Perpiñà , M. Vellvehi, D. Sánchez, A. GarcÃa-Bediaga Analysis of natural convection cooling solutions for GaN HEMT transistors published pages: , ISSN: , DOI: |
20th European Conference on Power Electronics and Applications | 2019-06-18 |
2018 |
Meneghini M. et al. Challenges towards highly reliabile GaN power transistors published pages: , ISSN: , DOI: |
GaN Marathon 2018 | 2019-06-18 |
2017 |
I. Rossetto, M. Meneghini, E. Canato, M. Barbato, S. Stoffels, N. Posthuma, S. Decoutere, A.N. Tallarico, G. Meneghesso, E. Zanoni Field- and current-driven degradation of GaN-based power HEMTs with p-GaN gate: Dependence on Mg-doping level published pages: 298-303, ISSN: 0026-2714, DOI: 10.1016/j.microrel.2017.06.061 |
Microelectronics Reliability 76-77 | 2019-06-18 |
2017 |
L. Stockmeier, L. Lehmann, A. Miller, C. Reimann, J. Friedrich Dislocation formation in heavily As-doped Czochralski grown silicon published pages: 1600373, ISSN: 0232-1300, DOI: 10.1002/crat.201600373 |
Crystal Research and Technology 52/8 | 2019-06-18 |
2018 |
Xavier Jorda, Ander Avila, Asier Garcia-Bediaga, Xavier Perpiña, Miquel Vellvehi Analysis of natural convection cooling solutions for GaN HEMT transistors published pages: , ISSN: , DOI: |
European Conference on Power Electronics and Applications | 2019-06-18 |
2017 |
Matteo Borga, Matteo Meneghini, Isabella Rossetto, Steve Stoffels, Niels Posthuma, Marleen Van Hove, Denis Marcon, Stefaan Decoutere, Gaudenzio Meneghesso, Enrico Zanoni Evidence of Time-Dependent Vertical Breakdown in GaN-on-Si HEMTs published pages: 3616-3621, ISSN: 0018-9383, DOI: 10.1109/TED.2017.2726440 |
IEEE Transactions on Electron Devices 64/9 | 2019-06-18 |
2018 |
H Amano, Y Baines, E Beam, Matteo Borga, T Bouchet, Paul R Chalker, M Charles, Kevin J Chen, Nadim Chowdhury, Rongming Chu, Carlo De Santi, Maria Merlyne De Souza, Stefaan Decoutere, L Di Cioccio, Bernd Eckardt, Takashi Egawa, P Fay, Joseph J Freedsman, L Guido, Oliver Häberlen, Geoff Haynes, Thomas Heckel, Dilini Hemakumara, Peter Houston, Jie Hu, Mengyuan Hua, Qingyun Huang, Alex Huang, Sheng Jiang, H Kawai, Dan Kinzer, Martin Kuball, Ashwani Kumar, Kean Boon Lee, Xu Li, Denis Marcon, Martin März, R McCarthy, Gaudenzio Meneghesso, Matteo Meneghini, E Morvan, A Nakajima, E M S Narayanan, Stephen Oliver, Tomás Palacios, Daniel Piedra, M Plissonnier, R Reddy, Min Sun, Iain Thayne, A Torres, Nicola Trivellin, V Unni, Michael J Uren, Marleen Van Hove, David J Wallis, J Wang, J Xie, S Yagi, Shu Yang, C Youtsey, Ruiyang Yu, Enrico Zanoni, Stefan Zeltner, Yuhao Zhang The 2018 GaN power electronics roadmap published pages: 163001, ISSN: 0022-3727, DOI: 10.1088/1361-6463/aaaf9d |
Journal of Physics D: Applied Physics 51/16 | 2019-06-18 |
2018 |
M.Lenzhofer, A. Frank Efficiency and Near-Field Emission Comparisons of a Si- and GaN Based Buck Converter Topology published pages: , ISSN: , DOI: |
IEEE- PEMC 2018 | 2019-06-18 |
2017 |
Xiangdong Li, Marleen Van Hove, Ming Zhao, Karen Geens, Vesa-Pekka Lempinen, Jaakko Sormunen, Guido Groeseneken, Stefaan Decoutere 200 V Enhancement-mode p-GaN HEMTs Fabricated on 200 mm GaN-on-SOI with Trench Isolation for Monolithic Integration published pages: 1-1, ISSN: 0741-3106, DOI: 10.1109/LED.2017.2703304 |
IEEE Electron Device Letters | 2019-06-18 |
2016 |
Jie Hu, Steve Stoffels, Silvia Lenci, Brice De Jaeger, Nicolo Ronchi, Andrea Natale Tallarico, Dirk Wellekens, Shuzhen You, Benoit Bakeroot, Guido Groeseneken, Stefaan Decoutere Statistical Analysis of the Impact of Anode Recess on the Electrical Characteristics of AlGaN/GaN Schottky Diodes With Gated Edge Termination published pages: 3451-3458, ISSN: 0018-9383, DOI: 10.1109/TED.2016.2587103 |
IEEE Transactions on Electron Devices 63/9 | 2019-06-18 |
2017 |
D. Poppitz, S. Brand, A. Graff, T. Detzel, O. Häberlen, G. Prechtl, F. Altmann Strain analysis and dicing defects of GaN on Si substrates published pages: , ISSN: , DOI: |
41st Workshop on Compound Semiconductor Devices and Integrated Circuits Held in Europe | 2019-06-18 |
2016 |
A. Dzarasova QDB: A new database of plasma chemistries and reactions – concept and exemplar verification published pages: , ISSN: , DOI: |
IOP Plasma physics conference | 2019-06-18 |
2016 |
Hofer V., Leitner J., Nowak T Determination of guard bands for quality characteristics using copula-based models for longitudinal data published pages: , ISSN: , DOI: |
The Deutsche Arbeitsgemeinschaft Statistik (DAGStat) 2016 | 2019-06-18 |
2017 |
L. Lymperakis and J. Neugebauer Thermodynamics, kinetics, and electronic structure of H2 and F2 passivation of defect states in GaN: An ab-initio study published pages: , ISSN: , DOI: |
41st Workshop on Compound Semiconductor Devices and Integrated Circuits Held in Europe | 2019-06-18 |
2017 |
J. Marek, A. Å atka, M. Jagelka, A. Chvála, P. PrÃbytný, M. Donoval and D. Donoval Modern p-GaN power devices under UIS conditions published pages: , ISSN: , DOI: |
41st Workshop on Compound Semiconductor Devices and Integrated Circuits Held in Europe | 2019-06-18 |
2017 |
Ales Chvala, Juraj Marek, Patrik Pribytny, Alexander Satka, Martin Donoval, Daniel Donoval Effective 3-D Device Electrothermal Simulation Analysis of Influence of Metallization Geometry on Multifinger Power HEMTs Properties published pages: 333-336, ISSN: 0018-9383, DOI: 10.1109/TED.2016.2629024 |
IEEE Transactions on Electron Devices 64/1 | 2019-06-18 |
2017 |
M. Borga, M. Meneghini, I. Rossetto, M. Silvestri, O. Haeberlen, T. Detzel, G. Meneghesso, E. Zanoni Buffer-induced vertical leakage and charge trapping in normally-off GaN-on-Si HEMTs published pages: , ISSN: , DOI: |
41st Workshop on Compound Semiconductor Devices and Integrated Circuits Held in Europe | 2019-06-18 |
2017 |
Vera Hofer, Karl-Franzens-University, Graz, Austria; Thomas Nowak Guardbanding based on Device Drift Behavior published pages: , ISSN: , DOI: |
Nineteenth Annual Automotive Electronics Reliability Workshop | 2019-06-18 |
2017 |
F. P. Pribahsnik, M. Nelhiebel, M. Mataln, M. Bernardoni, G. Prechtl, F. Altmann, D. Poppitz, A. Lindemann High temperature failure mode in power GaN devices published pages: , ISSN: , DOI: |
41st Workshop on Compound Semiconductor Devices and Integrated Circuits Held in Europe | 2019-06-18 |
2017 |
A. Barbato, M. Barbato, M. Meneghini, M. Silvestri, T. Detzel, O. Haeberlen, G. Meneghesso, E. Zanoni A Novel System to Measure the Dynamic On-Resistance of On-Wafer 600 V Normally-Off GaN HEMTs in Real Application Conditions published pages: , ISSN: , DOI: |
41st Workshop on Compound Semiconductor Devices and Integrated Circuits Held in Europe | 2019-06-18 |
2016 |
AleÅ¡ Chvála, Juraj Marek, Patrik PrÃbytný, Alexander Å atka and Daniel Donoval Model of power InAlN/GaN HEMT for 3-D Electrothermal Simulations published pages: , ISSN: , DOI: |
International MOS-AK Workshop | 2019-06-18 |
2017 |
Jonathan Tennyson, Sara Rahimi, Christian Hill, Lisa Tse, Anuradha Vibhakar, Dolica Akello-Egwel, Daniel B Brown, Anna Dzarasova, James R Hamilton, Dagmar Jaksch, Sebastian Mohr, Keir Wren-Little, Johannes Bruckmeier, Ankur Agarwal, Klaus Bartschat, Annemie Bogaerts, Jean-Paul Booth, Matthew J Goeckner, Khaled Hassouni, Yukikazu Itikawa, Bastiaan J Braams, E Krishnakumar, Annarita Laricchiuta, Nigel J Mason, Sumeet Pandey, Zoran Lj Petrovic, Yi-Kang Pu, Alok Ranjan, Shahid Rauf, Julian Schulze, Miles M Turner, Peter Ventzek, J Christopher Whitehead, Jung-Sik Yoon QDB: a new database of plasma chemistries and reactions published pages: 55014, ISSN: 1361-6595, DOI: 10.1088/1361-6595/aa6669 |
Plasma Sources Science and Technology 26/5 | 2019-06-18 |
2016 |
J. Marek, M. Jagelka, A. Chvála, P. PrÃbytný, M.Donoval and D. Donoval UIS Capability of Modern GaN Power Devices published pages: , ISSN: , DOI: |
3rd international conference on advances in electronic and photonic technologies | 2019-06-18 |
2017 |
K. Geens, M. Van Hove, X. Li, M. Zhao, A. Å atka, A. Vincze and S. Decoutere CMOS Process-Compatible 200mm polycrystalline AlN Substrates for GaN Power Transistors published pages: , ISSN: , DOI: |
41st Workshop on Compound Semiconductor Devices and Integrated Circuits Held in Europe | 2019-06-18 |
2017 |
M. Glavanovics, S. Ofner, R. Sleik, M. Nelhiebel, A. Madan, O. Haeberlen Application Related Reliability Test Concept for GaN HEMT Power Devices published pages: , ISSN: , DOI: |
41st Workshop on Compound Semiconductor Devices and Integrated Circuits Held in Europe | 2019-06-18 |
2015 |
Sebastian Mohr, Anna Dzarasova, Dimitrios Tsamados, Vaibhav Deshpande, Mohamed Oulmane, Jonathan Tennyson From Plasma Reactor to Surface Level: Linking Plasma with Feature Profile Simulations published pages: , ISSN: , DOI: |
American Vacuum Society Symopsium | 2019-06-18 |
2016 |
Ming Zhao, Juraj Priesol, Alexander Satka, Lukasz Janicki, Michal Baranowski, Jan Misiewicz, Robert Kudrawiec, Yoga Nrusimha Saripalli MOCVD Growth and Characterizations of Unintentionally and Intentionally C doped GaN on 200 mm Si (111) published pages: , ISSN: , DOI: |
18th International Conference on Metal Organic Vapor Phase Epitaxy | 2019-06-18 |
2017 |
J. Priesol, A. Šatka, A. Chvála, S. Stoffels, S. Decoutere Identification of critical regions in AlGaN/GaN-on-Si Schottky barrier diode using Electron beam induced current method published pages: , ISSN: , DOI: |
Identification of critical regions in AlGaN/GaN-on-Si Schottky barrier diode using Electron beam induced current method | 2019-06-18 |
2017 |
S. Stoffels, K. Geens, M. Zhao, H. Liang, M. Van Hove and S. Decoutere Next generation 200mm substrates for GaN power devices published pages: , ISSN: , DOI: |
41st Workshop on Compound Semiconductor Devices and Integrated Circuits Held in Europe | 2019-06-18 |
2017 |
S. Brand, B. Boettge, J. Zijl, S. Kersjes, T. Behrens, Evaluation of the capabilities of scanning acoustic microscopy towards assessing the porosity of Ag-sinter layers for GaN based power electronics published pages: , ISSN: , DOI: |
41st Workshop on Compound Semiconductor Devices and Integrated Circuits Held in Europe | 2019-06-18 |
2016 |
S. Rahimi, C. Hill, L. Tse, A. Vibhakar, S. Mohr, J.R. Hamilton, A. Dzarasova, D.B. Brown, J. Tennyson Constructing self-consistent validated plasma chemistry published pages: , ISSN: , DOI: |
The 38th International Symposium on Dry Process (DPS2016) | 2019-06-18 |
2016 |
Ming Zhao, Steve Stoffels, Marleen Van Hove, Prem Kumar Kandaswamy, Hu Liang, Yoga Nrusimha Saripalli, Stefaan Decoutere Study on the Dispersion Control of AlGaN/GaN Buffers Grown by MOCVD on 200 mm Si (111) published pages: , ISSN: , DOI: |
18th International Conference on Metal Organic Vapor Phase Epitaxy | 2019-06-18 |
2017 |
Karen Geens First time demonstration of fully isolated GaN power devices using SOI technology published pages: , ISSN: , DOI: |
imec magazine | 2019-06-18 |
2017 |
M. Ruzzarin, A. Barbato, M. Meneghini, I. Rossetto, M. Silvestri, O. Haeberlen, T. Detzel, G. Meneghesso, E. Zanoni Study of trapping in GaN-based power HEMTs based on High-Voltage Double-Pulsed Backgating Measurement System published pages: , ISSN: , DOI: |
41st Workshop on Compound Semiconductor Devices and Integrated Circuits Held in Europe | 2019-06-18 |
2015 |
Sebastian Mohr, Anna Dzarasova, Dimitrios Tsamados, Vaibhav Deshpande, Mohamed Oulmane, Jonathan Tennyson Linking reactor-scale plasma modelling with feature-scale profile published pages: , ISSN: , DOI: |
Dry Process Symposium | 2019-06-18 |
2017 |
X. Li; M. Van Hove; M. Zhao; K. Geens; V. P. Lempinen; J. Sormunen; G. Groeseneken; S. Decoutere 200 V Enhancement-mode p-GaN HEMTs Fabricated on 200 mm GaN-on-SOI with Trench Isolation for Monolithic Integration published pages: , ISSN: , DOI: |
41st Workshop on Compound Semiconductor Devices and Integrated Circuits Held in Europe | 2019-06-18 |
2016 |
Matteo Meneghini, Isabella Rossetto, Vanessa Rizzato, Steve Stoffels, Marleen Van Hove, Niels Posthuma, Tian-Li Wu, Denis Marcon, Stefaan Decoutere, Gaudenzio Meneghesso, Enrico Zanoni Gate Stability of GaN-Based HEMTs with P-Type Gate published pages: 14, ISSN: 2079-9292, DOI: 10.3390/electronics5020014 |
Electronics 5/2 | 2019-06-18 |
2016 |
L. Stockmeier, L. Lehmann, C. Reimann, J. Friedrich Possible reasons for dislocation formation in heavily doped Czochralski silicon published pages: , ISSN: , DOI: |
1st German Czechoslovak Conference on Crystal Growth | 2019-06-18 |
2016 |
Vera Hofer, Johannes Leitner, Horst Lewitschnig, Thomas Nowak Guardbanding Techniques for the Semiconductor Industry: A Comparative Study published pages: , ISSN: , DOI: |
The Joint Statistical Meeting – JSM2016 | 2019-06-18 |
2016 |
J. Friedrich, L. Stockmeier, L. Lehmann, C. Reimann Possible reasons for dislocation formation in heavily doped Czochralski silicon published pages: , ISSN: , DOI: |
10th International Conference of Polish Society for Crystal Growth - ICPSCG10 | 2019-06-18 |
2016 |
Sara Rahimi, James Hamilton, Christian Hill, Jonathan Tennyson QDB: Validated Plasma Chemistries Database published pages: , ISSN: , DOI: |
69TH ANNUAL GASEOUS ELECTRONICS CONFERENCE – GEC | 2019-06-18 |
2016 |
Jonathan Tennyson, Christian Hill, Sara Rahimi QDB: A sustainable database for plasma chemistries†in International Workshop on Plasmas for Energy and Environmental Applications published pages: , ISSN: , DOI: |
International Workshop on Plasmas for Energy and Environmental Applications – IWPEEA2016 | 2019-06-18 |
2016 |
Ben Rackauskas, , Michael J Uren, Steve Stoffels and Martin Kuball, Processes behind Suppressed Current Collapse Buffer Architectures published pages: , ISSN: , DOI: |
The International Workshop on Nitride Semiconductors 2016 | 2019-06-18 |
2016 |
L. Stockmeier, L. Lehmann, C. Reimann, J. Friedrich Possible reasons for dislocation formation in heavily doped Czochralski silicon published pages: , ISSN: , DOI: |
The International Conference on Crystal Growth and Epitaxy -ICCGE-18 | 2019-06-18 |
Are you the coordinator (or a participant) of this project? Plaese send me more information about the "POWERBASE" project.
For instance: the website url (it has not provided by EU-opendata yet), the logo, a more detailed description of the project (in plain text as a rtf file or a word file), some pictures (as picture files, not embedded into any word file), twitter account, linkedin page, etc.
Send me an email (fabio@fabiodisconzi.com) and I put them in your project's page as son as possible.
Thanks. And then put a link of this page into your project's website.
The information about "POWERBASE" are provided by the European Opendata Portal: CORDIS opendata.