AUTOMICS

Pragmatic solution for parasitic-immune design of electronics ICs for automotive

Coordinatore	UNIVERSITE PIERRE ET MARIE CURIE - PARIS 6    more  Organization address address: Place Jussieu 4 city: PARIS postcode: 75252 contact info Titolo: Dr. Nome: Stéphanie Cognome: ROSSARD Email: send email Telefono: +33 144279712 Fax: +33 144277467
Nazionalità Coordinatore	France [FR]
Totale costo	5˙748˙892 €
EC contributo	3˙547˙917 €
Programma	FP7-ICT Specific Programme "Cooperation": Information and communication technologies
Code Call	FP7-2012-ICT-GC
Funding Scheme	CP
Anno di inizio	2012
Periodo (anno-mese-giorno)	2012-07-01   -   2015-08-31

 Partecipanti

#	participant	country	role	EC contrib. [€]
1	UNIVERSITE PIERRE ET MARIE CURIE - PARIS 6  Organization address address: Place Jussieu 4 city: PARIS postcode: 75252 contact info Titolo: Dr. Nome: Stéphanie Cognome: ROSSARD Email: send email Telefono: +33 144279712 Fax: +33 144277467	FR (PARIS)	coordinator	0.00
2	ADMOS GMBH ADVANCED MODELING SOLUTIONS  Organization address address: IN DEN GERNACKERN city: FRICKENHAUSEN postcode: 72636 contact info Titolo: Dr. Nome: Thomas Cognome: Gneiting Email: send email Telefono: +49 7025 911698 10 Fax: +49 7025 911698 99	DE (FRICKENHAUSEN)	participant	0.00
3	AMS AG  Organization address address: TOBELBADERSTRASSE city: UNTERPREMSTAETTEN postcode: 8141 contact info Titolo: Mr. Nome: Christian Cognome: Siller Email: send email Telefono: 4331370000000 Fax: 4331370000000	AT (UNTERPREMSTAETTEN)	participant	0.00
4	CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE  Organization address address: RUE MICHEL -ANGE city: PARIS postcode: 75794 contact info Titolo: Ms. Nome: Aline Cognome: Duynslaeger Email: send email Telefono: +33 5 61336006	FR (PARIS)	participant	0.00
5	CONTINENTAL AUTOMOTIVE FRANCE SAS  Organization address address: Avenue Paul Ourliac city: TOULOUSE postcode: 31036 contact info Titolo: Mr. Nome: Louis-Claude Cognome: Vrignaud Email: send email Telefono: +33 5 61 19 88 43	FR (TOULOUSE)	participant	0.00
6	ECOLE POLYTECHNIQUE FEDERALE DE LAUSANNE  Organization address address: BATIMENT CE 3316 STATION 1 city: LAUSANNE postcode: 1015 contact info Titolo: Prof. Nome: Maher Cognome: Kayal Email: send email Telefono: 41216933981 Fax: 41216933640	CH (LAUSANNE)	participant	0.00
7	INSTITUT NATIONAL DES SCIENCES APPLIQUEES DE TOULOUSE INSAT  Organization address address: AVENUE DE RANGUEIL city: TOULOUSE CEDEX 4 postcode: 31077 contact info Titolo: Prof. Nome: Raoul Cognome: FRANCOIS Email: send email Telefono: +33 561559948	FR (TOULOUSE CEDEX 4)	participant	0.00
8	STMICROELECTRONICS SRL  Organization address address: VIA C.OLIVETTI city: AGRATE BRIANZA postcode: 20864 contact info Titolo: Dr. Nome: Sara Cognome: Loi Email: send email Telefono: 390396000000 Fax: +39 0396035910	IT (AGRATE BRIANZA)	participant	0.00
9	UNIVERSITE PAUL SABATIER TOULOUSE III  Organization address address: ROUTE DE NARBONNE city: TOULOUSE postcode: 31062 contact info Titolo: Mrs. Nome: Carole Cognome: MATTHIA Email: send email Telefono: +33 561556604 Fax: +33 561557313	FR (TOULOUSE)	participant	0.00
10	VALEO EQUIPEMENTS ELECTRIQUES MOTEUR SAS  Organization address address: 2 RUE ANDRE BOULLE city: CRETEIL postcode: 94000 contact info Titolo: Mr. Nome: Antoine Cognome: de MONTS Email: send email Telefono: 33148988666 Fax: +33 142072982	FR (CRETEIL)	participant	0.00

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 Obiettivo del progetto (Objective)

Smart Power ICs are extensively used in automotive embedded systems due to their unique capabilities to merge low power and high voltage devices on the same chip, at competitive cost. In such devices, induced electrical coupling noise due to switching of the power stages, when integrating such high voltage (HV) devices with low voltage (LV) functions, is a big issue. During switching, parasitic voltages and currents, consisting of electrons and holes, lead to a local shift of the substrate potential that can reach hundreds of millivolts. This electrical coupling noise can severely disturb low voltage circuits. Such parasitic signals are known to represent the major cause of failure and costly circuit redesign in power integrated circuits. Furthermore, parasitic carrier injections are considerably increased under high temperature operation such as those encountered in automotive applications where this problem is even more severe since these dedicated IC's need to be highly reliable and stable with time. Most solutions are layout dependent and are thus difficult to optimize using available electrical simulator software. The lack for a model strategy that would enable to simulate accurately the injection of minority carriers in the substrate as part of the HV model, as well as its propagation in the substrate, is one of the main reasons for this critical situation. This lack for a design methodology prohibits an efficient design strategy and fails at giving clear predictions of perturbations in high voltage integrated circuits. This picture motivates this project proposal where all these aspects are addressed to create a link between circuit design, modeling and implementation in innovative computer aided design tools. This concerns smart power IC's dedicated to automotive applications requiring co-integration of high voltage power stages with low voltage analog/digital blocks on the same chip, still being reliablenwhen operating at high temperature.