D-TXM

Diffraction Based Transmission X-ray Microscopy

Coordinatore	DANMARKS TEKNISKE UNIVERSITET    more Spiacenti, non ci sono informazioni su questo coordinatore. Contattare Fabio per maggiori infomrazioni, grazie.
Nazionalità Coordinatore	Denmark [DK]
Totale costo	2˙499˙860 €
EC contributo	2˙499˙860 €
Programma	FP7-IDEAS-ERC Specific programme: "Ideas" implementing the Seventh Framework Programme of the European Community for research, technological development and demonstration activities (2007 to 2013)
Code Call	ERC-2011-ADG_20110209
Funding Scheme	ERC-AG
Anno di inizio	2012
Periodo (anno-mese-giorno)	2012-10-01   -   2017-09-30

 Partecipanti

#	participant	country	role	EC contrib. [€]
1	DANMARKS TEKNISKE UNIVERSITET  Organization address address: Anker Engelundsvej 1, Building 101A city: KONGENS LYNGBY postcode: 2800 contact info Titolo: Mr. Nome: Henning Bo Cognome: Nicolajsen Email: send email Telefono: +4546 775762	DK (KONGENS LYNGBY)	hostInstitution	2˙499˙860.00
2	DANMARKS TEKNISKE UNIVERSITET  Organization address address: Anker Engelundsvej 1, Building 101A city: KONGENS LYNGBY postcode: 2800 contact info Titolo: Prof. Nome: Henning Friis Cognome: Poulsen Email: send email Telefono: +45 45253119 Fax: -775759	DK (KONGENS LYNGBY)	hostInstitution	2˙499˙860.00

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 Obiettivo del progetto (Objective)

'The aim of this project is to develop a diffraction based transmission X-ray microscope, d-TXM, for non-destructive structural characterization of polycrystalline materials such as metals, ceramics, semiconductors, dust, soil and rocks, and for R&D applications in e.g. the energy-, electronics- and environmental sectors. Uniquely, d-TXM will be able to visualise the grains inside 100 micrometer thick specimens with a spatial resolution of 10-30 nm. Up to a thousand grains may be mapped simultaneously in three dimensions with respect to morphology, phase, orientation and local stress-state. Furthermore, the method will be sufficiently fast to enable the acquisition of 3D movies of the time evolution of the structure in nano-materials and components during synthesis, processing or operation. During the last decade the applicant pioneered and matured a set of X-ray based methods for 3D studies of polycrystals on the micrometre scale. For this achievement, he is recognized as a worldwide leading figure in X-ray instrumentation for structural materials, situated at a nodal point between materials, X-ray physics, applied mathematics and crystallography. The underlying vision of d-TXM is similar to this past work, but in terms of optics the microscopy approach is radically different and the spatial resolution will be two orders of magnitude better. In this project, the scientific potential will be demonstrated by means of applications to selected issues in metallurgy. Being able to directly observe the evolution of the individual crystalline elements, our understanding of processes such as plasticity and phase evolution can be greatly enhanced. Dissemination to other fields will take place via an advisory board of future users and a workshop. Continuity of the project is ensured by the technique being implemented at the European Synchrotron Research Facility.'