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SBSI SIGNED

Structure-based subwavelength imaging

Total Cost €

EC-Contrib. €

Partnership

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SBSI project word cloud

Explore the words cloud of the SBSI project. It provides you a very rough idea of what is the project "SBSI" about.

platform impossible micro detection wavelength industry achievement iterations reducing basis connected purpose mathematical sem software commercialization team demonstration prototype form closely fundamental exposures sparse appropriate storm prior florescent microscopy limit resolution scanning imaging perform optical below electron until algorithmic defects chip image poc few microscope represented compact algorithmically fifth

Project "SBSI" data sheet

The following table provides information about the project.

Coordinator	TECHNION - ISRAEL INSTITUTE OF TECHNOLOGY Organization address address: SENATE BUILDING TECHNION CITY city: HAIFA postcode: 32000 website: www.technion.ac.il contact info title: n.a. name: n.a. surname: n.a. function: n.a. email: n.a. telephone: n.a. fax: n.a.
Coordinator Country	Israel [IL]
Total cost	150˙000 €
EC max contribution	150˙000 € (100%)
Programme	1. H2020-EU.1.1. (EXCELLENT SCIENCE - European Research Council (ERC))
Code Call	ERC-2015-PoC
Funding Scheme	ERC-POC
Starting year	2015
Duration (year-month-day)	from 2015-11-01 to 2017-04-30

Partnership

Take a look of project's partnership.

#	participants	country	role	EC contrib. [€]
1	TECHNION - ISRAEL INSTITUTE OF TECHNOLOGY TECHNION - ISRAEL INSTITUTE OF TECHNOLOGY Organization address address: SENATE BUILDING TECHNION CITY city: HAIFA postcode: 32000 website: www.technion.ac.il contact info title: n.a. name: n.a. surname: n.a. function: n.a. email: n.a. telephone: n.a. fax: n.a.	IL (HAIFA)	coordinator	150˙000.00

Map

Project objective

Until recently it was believed to be impossible to perform optical imaging with resolution beyond the fundamental resolution limit. However, in the past few years, our team was able to algorithmically enhance the resolution of optical imaging, bringing it to below one fifth of the optical wavelength. This achievement is based on the prior knowledge that the image is “sparse”, that is, the image can be represented in a compact form in an appropriate mathematical basis. The purpose of this PoC is to develop an algorithmic platform – a software demonstration prototype - that would lead to commercialization of two (closely connected) applications: (1) Improving the resolution of Scanning Electron Microscope (SEM), used in the micro-chip industry for defects detection; (2) Improving high-resolution florescent microscopy (STORM) by reducing the number of exposures (iterations) required.

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The information about "SBSI" are provided by the European Opendata Portal: CORDIS opendata.